A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

YU Wan-Li; LUO Yong-An; WANG Ming-Zhi; ZHENG Qiu-Ju; ZHANG Hui-Jun; TIAN Yu-Lian; HUANG Wan-Xia

Chinese Physics C> 2001, Vol. 25> Issue(S1) : 110-115

A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

College of Material Science and Engineering,Yanshan University,Qinhuangdao 066004,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

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Abstract：
A new method was put forward to determine the orientations of crystal defects by synchrotron radiation.Instead of using monochromic radiation as it was done before,a simple method was proposed using white radiation to calculate directions of crystal defects.In order to do so,at least two topographs with different beam incident directions were needed.The direction of an image of a defect should be figured out first.It can be fixed by the angles between the direction of the image and [100],[010]and [001].Suppose the direction of the topograph is [u₁ v₁ w₁]and the direction of the image in the first topograph is [cosα₁₁,cosβ₁₁,cosγ₁₁],α₁₁,β₁₁ and γ₁₁ are the angles between the image and [100],[010] and [001],respectively,then the direction of the defect should be in thd plane with normal n₁=[u₁ v₁ w₁]×[cosα₁₁,cosβ₁₁,cosγ₁₁].Similarly,in the second topograph,the normal of the plane in which the same defect lies is n₂=[u₂ v₂ w₂]×[cosα₁₂,cosβ₁₂,cosγ₁₂],in which [u₂ v₂ w₂] is the direction of the second topograph,α₁₂,β₁₂, and γ₁₂ are the angles between the direction of the image and [100],[010] and [001].Since the defect are normal to n₁ and n₂,its direction n can be calculated out as n=n₁×n₂=[u v w].Using this method,the directions of dislocations in natural diamond were calculated and the types of the dislocations were figured out.

References

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YU Wan-Li, LUO Yong-An, WANG Ming-Zhi, ZHENG Qiu-Ju, ZHANG Hui-Jun, TIAN Yu-Lian and HUANG Wan-Xia. A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation[J]. Chinese Physics C, 2001, 25(S1): 110-115.

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Received: 1900-01-01
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

Corresponding author: YU Wan-Li,

College of Material Science and Engineering,Yanshan University,Qinhuangdao 066004,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

Received Date: 1900-01-01

Accepted Date: 1900-01-01

Available Online: 2001-06-22

Abstract: A new method was put forward to determine the orientations of crystal defects by synchrotron radiation.Instead of using monochromic radiation as it was done before,a simple method was proposed using white radiation to calculate directions of crystal defects.In order to do so,at least two topographs with different beam incident directions were needed.The direction of an image of a defect should be figured out first.It can be fixed by the angles between the direction of the image and [100],[010]and [001].Suppose the direction of the topograph is [u₁ v₁ w₁]and the direction of the image in the first topograph is [cosα₁₁,cosβ₁₁,cosγ₁₁],α₁₁,β₁₁ and γ₁₁ are the angles between the image and [100],[010] and [001],respectively,then the direction of the defect should be in thd plane with normal n₁=[u₁ v₁ w₁]×[cosα₁₁,cosβ₁₁,cosγ₁₁].Similarly,in the second topograph,the normal of the plane in which the same defect lies is n₂=[u₂ v₂ w₂]×[cosα₁₂,cosβ₁₂,cosγ₁₂],in which [u₂ v₂ w₂] is the direction of the second topograph,α₁₂,β₁₂, and γ₁₂ are the angles between the direction of the image and [100],[010] and [001].Since the defect are normal to n₁ and n₂,its direction n can be calculated out as n=n₁×n₂=[u v w].Using this method,the directions of dislocations in natural diamond were calculated and the types of the dislocations were figured out.

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A New Method to Determine the Orientations of Crystal Defects by Synchrotron Radiation

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