The Analysis of 3γ/2γ in the Measurement of Positron Annihilation Doppler-broadening Spectroscopy

ZHOU Chun-Lan; ZHANG Tian-Bao; MA Chuang-Xing; ZHANG Zhi-Ming; CAO Xing-Zhong; WANG Bao-Yi; WEI Long

Chinese Physics C> 2006, Vol. 30> Issue(1) : 84-87

The Analysis of 3γ/2γ in the Measurement of Positron Annihilation Doppler-broadening Spectroscopy

Laboratory of Nuclear Analytical Technology,Institute of High Energy Physics,CAS,Beijing 100049,China

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Abstract：
Doppler-broadening slow positron annihilation spectroscopy is used to measure the concentration, spatial distribution, and size of open-volume defects in surface and interface of material. In this method, the quantitative evaluation is generally carried out with the line shape parameter S and W, but sometimes the parameters provide some finite information. For example, if positron and electron form positronium (include o-Ps and p-Ps) in material, the parameters S and W may provide little information about positronium even complicate the analyses. A parameter I_3γ, defined as o-Ps self-decay intensity, was used to analyze Ag layer capped and non-capped silica aerogel by slow positron annihilation Doppler -broadening spectroscopy. The result shows that I_3γ can provide more information for researching mesoporous material and nanometer film.

References

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ZHOU Chun-Lan, ZHANG Tian-Bao, MA Chuang-Xing, ZHANG Zhi-Ming, CAO Xing-Zhong, WANG Bao-Yi and WEI Long. The Analysis of 3γ/2γ in the Measurement of Positron Annihilation Doppler-broadening Spectroscopy[J]. Chinese Physics C, 2006, 30(1): 84-87.

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Received: 2005-04-11
Revised: 1900-01-01

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通讯作者: 陈斌, [email protected]

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沈阳化工大学材料科学与工程学院沈阳 110142

The Analysis of 3γ/2γ in the Measurement of Positron Annihilation Doppler-broadening Spectroscopy

Corresponding author: ZHOU Chun-Lan,

Laboratory of Nuclear Analytical Technology,Institute of High Energy Physics,CAS,Beijing 100049,China

Received Date: 2005-04-11

Accepted Date: 1900-01-01

Available Online: 2006-01-05

Abstract: Doppler-broadening slow positron annihilation spectroscopy is used to measure the concentration, spatial distribution, and size of open-volume defects in surface and interface of material. In this method, the quantitative evaluation is generally carried out with the line shape parameter S and W, but sometimes the parameters provide some finite information. For example, if positron and electron form positronium (include o-Ps and p-Ps) in material, the parameters S and W may provide little information about positronium even complicate the analyses. A parameter I_3γ, defined as o-Ps self-decay intensity, was used to analyze Ag layer capped and non-capped silica aerogel by slow positron annihilation Doppler -broadening spectroscopy. The result shows that I_3γ can provide more information for researching mesoporous material and nanometer film.

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The Analysis of 3γ/2γ in the Measurement of Positron Annihilation Doppler-broadening Spectroscopy

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