The beam-based calibration of an X-ray pinhole camera at SSRF

LENG Yong-Bin; HUANG Guo-Qing; ZHANG Man-Zhou; CHEN Zhi-Chu; CHEN Jie; YE Kai-Rong

doi:10.1088/1674-1137/36/1/014

Chinese Physics C> 2012, Vol. 36> Issue(1) : 80-83 DOI: 10.1088/1674-1137/36/1/014

The beam-based calibration of an X-ray pinhole camera at SSRF

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Abstract：
A pinhole camera for imaging X-ray synchrotron radiation from a dipole magnet is now in operation at the Shanghai Synchrotron Radiation Facility (SSRF) storage ring. The electron beam size is derived by unfolding the radiation image and the point spread function (PSF) with deconvolution techniques. The performance of the pinhole is determined by the accuracy of the PSF measurement. This article will focus on a beam-based calibration scheme to measure the PSF system by varying the beam images with different quadrupole settings and fitting them with the corresponding theoretical beam sizes. Applying this method at SSRF, the PSF value of the pinhole is revised from 37 to 44 μm. The deviation in beam size between the theoretical value and the measured value is minimized to 4% after calibration. This optimization allows us to observe the horizontal disturbance due to injection down to as small as 0.5 μm.

References

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LENG Yong-Bin, HUANG Guo-Qing, ZHANG Man-Zhou, CHEN Zhi-Chu, CHEN Jie and YE Kai-Rong. The beam-based calibration of an X-ray pinhole camera at SSRF[J]. Chinese Physics C, 2012, 36(1): 80-83. doi: 10.1088/1674-1137/36/1/014

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Received: 2011-03-25
Revised: 2011-05-06

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通讯作者: 陈斌, [email protected]

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沈阳化工大学材料科学与工程学院沈阳 110142

The beam-based calibration of an X-ray pinhole camera at SSRF

Corresponding author: LENG Yong-Bin,

Received Date: 2011-03-25

Accepted Date: 2011-05-06

Available Online: 2012-01-05

Abstract: A pinhole camera for imaging X-ray synchrotron radiation from a dipole magnet is now in operation at the Shanghai Synchrotron Radiation Facility (SSRF) storage ring. The electron beam size is derived by unfolding the radiation image and the point spread function (PSF) with deconvolution techniques. The performance of the pinhole is determined by the accuracy of the PSF measurement. This article will focus on a beam-based calibration scheme to measure the PSF system by varying the beam images with different quadrupole settings and fitting them with the corresponding theoretical beam sizes. Applying this method at SSRF, the PSF value of the pinhole is revised from 37 to 44 μm. The deviation in beam size between the theoretical value and the measured value is minimized to 4% after calibration. This optimization allows us to observe the horizontal disturbance due to injection down to as small as 0.5 μm.

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The beam-based calibration of an X-ray pinhole camera at SSRF

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通讯作者: 陈斌, [email protected]

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