Preliminary result of bunch length measurement using a modified Michelson interferometer

LIN Xu-Ling; ZHANG Jian-Bing; LUO Feng; BEI Hua; LU Shan-Liang; YU Tie-Min; DAI Zhi-Min

doi:10.1088/1674-1137/33/10/015

Chinese Physics C> 2009, Vol. 33> Issue(10) : 901-904 DOI: 10.1088/1674-1137/33/10/015

Preliminary result of bunch length measurement using a modified Michelson interferometer

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Abstract：
Based on the femtosecond accelerator device which was built at the Shanghai Institute of Applied Physics (SINAP), recently a modified far infrared Michelson interferometer has been developed to measure the length of electron bunches via the optical autocorrelation method. Compared with our former normal Michelson interferometer, we use a hollow retroreflector instead of a flat mirror as the reflective mirror. The experimental setup and results of the bunch length measurement will be described in this paper.

References

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LIN Xu-Ling, ZHANG Jian-Bing, LUO Feng, BEI Hua, LU Shan-Liang, YU Tie-Min and DAI Zhi-Min. Preliminary result of bunch length measurement using a modified Michelson interferometer[J]. Chinese Physics C, 2009, 33(10): 901-904. doi: 10.1088/1674-1137/33/10/015

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Received: 2008-12-28
Revised: 2009-04-27

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通讯作者: 陈斌, [email protected]

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沈阳化工大学材料科学与工程学院沈阳 110142

Preliminary result of bunch length measurement using a modified Michelson interferometer

Corresponding author: LIN Xu-Ling,

Received Date: 2008-12-28

Accepted Date: 2009-04-27

Available Online: 2009-10-05

Abstract:

Based on the femtosecond accelerator device which was built at the Shanghai Institute of Applied Physics (SINAP), recently a modified far infrared Michelson interferometer has been developed to measure the length of electron bunches via the optical autocorrelation method. Compared with our former normal Michelson interferometer, we use a hollow retroreflector instead of a flat mirror as the reflective mirror. The experimental setup and results of the bunch length measurement will be described in this paper.

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Preliminary result of bunch length measurement using a modified Michelson interferometer

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通讯作者: 陈斌, [email protected]

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